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AC Kruseman
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11 records found
Calculation of the Doppler broadening of the electron-positron annihilation radiation in defect-free bulk materials
Journal article -
VJ Ghosh
,
M Alatalo
,
P Asoka-Kumar
,
B Nielsen
,
KG Lynn
,
AC Kruseman
,
P.E. Mijnarends
The positron annihilation 2D-ACAR technique in materials science
Abstract -
AC Kruseman
,
CV Falub
,
P.E. Mijnarends
,
A van Veen
Oxygen implanted silicon investigated by positron annihilation spectroscopy
Journal article -
AC Kruseman
,
H. Schut
,
A van Veen
,
M Fujinami
Buried oxide and defects in oxygen implanted Si monitored by positron annihilation
Journal article -
AC Kruseman
,
A van Veen
,
H. Schut
,
P.E. Mijnarends
,
M Fujinami
Two-dimensional ACAR and low background DBAR studies on materials with defects
Doctoral thesis -
AC Kruseman
Effect of lattice structure on the positron annihilation with inner shell electrons
Journal article -
M Alatalo
,
P Asoka-Kumar
,
VJ Ghosh
,
B Nielsen
,
KG Lynn
,
AC Kruseman
,
A van Veen
,
T Korhonen
,
MJ Puska
Two-detector Doppler broadening study of enhancement in Al
Journal article -
P.E. Mijnarends
,
AC Kruseman
,
A van Veen
,
H. Schut
,
A Bansil
Positron beam investigations of natural cubic and coated diamonds
Journal article -
AA Shiryaev
,
A van Veen
,
H. Schut
,
AC Kruseman
,
OD Zakharenko
The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation
Journal article -
VJ Ghosh
,
B Nielsen
,
AC Kruseman
,
P.E. Mijnarends
,
A van Veen
,
KG Lynn
Monitoring the water content of CASO-4 using positron annihilation
Abstract -
P.E. Mijnarends
,
AC Kruseman
,
A van Veen
Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system
Journal article -
AC Kruseman
,
H. Schut
,
A van Veen
,
P.E. Mijnarends
,
M Clement
,
JMM de Nijs