Copper Nanoparticle Sintering Enabled Hermetic Packaging With Fine Sealing Ring for MEMS Application

Journal Article (2023)
Author(s)

Dong Hu (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Mustafeez Bashir Shah (TU Delft - BUS/Quantum Delft, Student TU Delft)

Jiajie Fan (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Sten Vollebregt (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Guoqi Zhang (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/TED.2023.3312066 Final published version
More Info
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Publication Year
2023
Language
English
Related content
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Journal title
IEEE Transactions on Electron Devices
Issue number
11
Volume number
70
Pages (from-to)
5818 - 5823
Downloads counter
335
Collections
Institutional Repository
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Abstract

Driving by the increased demand for hermetic packaging in the more than Moore (MtM) roadmap, a Cu nanoparticle sintering-enabled hermetic sealing solution was developed with a small-size sealing ring. The developed technology simplifies microfabrication and requires less surface roughness using a sinterable Cu nanoparticle paste. A 50μm size Cu paste sealing ring was achieved using a lithography patterned photoresist as a stencil mask. A groove-structured chip was used to amplify localized stress. The Cu nanoparticle paste was fully sintered at 300 °C under pressure ranging from 10 to 40 MPa resulting in a robust bonding with a maximum shear strength of 280 MPa and implementing hermetic packaging. The deflection of the Si diaphragms estimated a vacuum level of 7 kPa. Vacuum sealing was maintained for over six months, and the lowest leak rate was calculated as 8.4× 10
-13Pa·m
3/s. The developed technology that comprises small-size patterning and pressure-assisted sintering offers the potential for a simple, cost-effective, but robust solution for hermetic packaging.

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