Worst-case bit line coupling backgrounds for open defects in SRAM cells
Conference Paper
(2009)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:e34bd218-c21b-4441-806f-9b3c30eb4559
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Publication Year
2009
Research Group
Computer Engineering
Pages (from-to)
25-30
ISBN (print)
978-90-73461-62-8
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