Thermal and moisture degradation in SSL system
Conference Paper
(2012)
Author(s)
S.W. Koh (TU Delft - Electronic Components, Technology and Materials)
Williem van Driel (TU Delft - Electronic Components, Technology and Materials)
Guo Qi Zhang (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/ESimE.2012.6191806
To reference this document use:
https://resolver.tudelft.nl/uuid:e40cb885-65e1-42e3-8013-c1d4b936a819
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
702-707
ISBN (print)
978-1-4673-1512-8
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