A Reliability Prediction for Integrated LED Lamp with Electrolytic Capacitor-Free Driver
Bo Sun (State Key Laboratory of Solid State Lighting, TU Delft - Electronic Components, Technology and Materials)
Xuejun Fan (State Key Laboratory of Solid State Lighting, Lamar University)
Lei Li (State Key Laboratory of Solid State Lighting)
Huaiyu Ye (Chongqing University)
Willem van Driel (TU Delft - Electronic Components, Technology and Materials, Philips Lighting Research)
Guo Qi Zhang (State Key Laboratory of Solid State Lighting, TU Delft - Electronic Components, Technology and Materials, Chinese Academy of Sciences)
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Abstract
This paper studies the interaction of catastrophic failure of the driver and LED luminous flux decay for an integrated LED lamp with an electrolytic capacitor-free LED driver. Electronic thermal simulations are utilized to obtain the lamp's dynamic history of temperature and current for two distinct operation modes: constant current mode (CCM) and constant light output (CLO) mode, respectively. Driver's mean time to failure (MTTF) and the LED's lifetime in terms of luminous flux are calculated. Under CLO mode, the LED's current increases exponentially to maintain the constant light output. As a result, the junction temperatures of LEDs, MOSFETs, and power diodes in driver rise significantly, leading to a much shorter MTTF and faster luminous flux depreciation. However, under the CCM, the junction temperatures of LEDs, MOSFETs, and diodes change modestly; therefore, the driver's MTTF and LED's luminous flux decay are not affected much by the variation of temperatures during LED's degradation process.