Single-crystelline hexagonal silicon-germanium

Journal Article (2017)
Author(s)

HIT Hauge (Eindhoven University of Technology)

T Hauge (Eindhoven University of Technology)

S. Conesa Boj (Eindhoven University of Technology, TU Delft - QN/Conesa-Boj Lab)

M. A. Verheijen (Philips Innovation Labs, Eindhoven University of Technology)

S. Koelling (Eindhoven University of Technology)

Erik P.A.M. Bakkers (TU Delft - QN/Bakkers Lab)

Research Group
QN/Conesa-Boj Lab
DOI related publication
https://doi.org/10.1021/acs.nanolett.6b03488
More Info
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Publication Year
2017
Language
English
Research Group
QN/Conesa-Boj Lab
Volume number
1
Pages (from-to)
85-90

Abstract

Group IV materials with the hexagonal diamond crystal structure have been predicted to exhibit promising optical and electronic properties. In particular, hexagonal silicon–germanium (Si1–xGex) should be characterized by a tunable direct band gap with implications ranging from Si-based light-emitting diodes to lasers and quantum dots for single photon emitters. Here we demonstrate the feasibility of high-quality defect-free and wafer-scale hexagonal Si1–xGex growth with precise control of the alloy composition and layer thickness. This is achieved by transferring the hexagonal phase from a GaP/Si core/shell nanowire template, the same method successfully employed by us to realize hexagonal Si. We determine the optimal growth conditions in order to achieve single-crystalline layer-by-layer Si1–xGex growth in the preferred stoichiometry region. Our results pave the way for exploiting the novel properties of hexagonal Si1–xGex alloys in technological applications.

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