Direct correspondence between HEB current-voltage characteristics and the current-dependent resistive transition
Conference Paper
(2005)
Author(s)
R Barends (TU Delft - QN/Fysics of NanoElectronics)
M. Hajenius (TU Delft - QN/Fysics of NanoElectronics)
Jian Gao (TU Delft - QN/Fysics of NanoElectronics)
Teun M. Klapwijk (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
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https://resolver.tudelft.nl/uuid:ebbb3670-0f4f-414e-a6a7-64e3ba110727
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Publication Year
2005
Research Group
QN/Fysics of NanoElectronics
Bibliographical Note
niet opgevoerd in 2005@en
Pages (from-to)
416-419
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