BIST enhancement for detecting bit/byte write enable faults in SOC SCRAMs
Conference Paper
(2008)
Author(s)
S Hamdioui (TU Delft - Computer Engineering)
Z Al-Ars (TU Delft - Computer Engineering)
J Jimenez (External organisation)
J Calero (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:ed3c4e23-b792-44f3-af5d-bd88af2c490e
More Info
expand_more
expand_more
Publication Year
2008
Research Group
Computer Engineering
Pages (from-to)
1-5
ISBN (print)
978-1-4244-2628-7
No files available
Metadata only record. There are no files for this record.