BIST enhancement for detecting bit/byte write enable faults in SOC SCRAMs

Conference Paper (2008)
Author(s)

S Hamdioui (TU Delft - Computer Engineering)

Z Al-Ars (TU Delft - Computer Engineering)

J Jimenez (External organisation)

J Calero (External organisation)

Research Group
Computer Engineering
More Info
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Publication Year
2008
Research Group
Computer Engineering
Pages (from-to)
1-5
ISBN (print)
978-1-4244-2628-7

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