Enhanced sensitivity of planar evanescent waveguide sensors

Abstract

This paper studies two different approaches for evanescent wave optical sensing: an horizontal one and a vertical one. In horizontal waveguides, the evanescent wave is distributed on the upper cladding. While in a vertical configuration, the evanescent wave is distributed on the left and right sides of the waveguide. In an horizontal configuration the evanescent wave can be also on both sides of the waveguide in order to increase the optical energy for sensing if the substrate under the waveguide is locally removed. However, in this configuration to achieve sensitive devices, the layers have to be freestanding and thin [1] limiting practical implementations of such approaches. Furthermore, very few materials can be defined as tall and thin in the case of a vertical configuration, as the deposition techniques often used (PECVD/LPCVD) are meant for films in the couple of micron range. In the following we will investigate the properties of the materials used but also the fabrication feasibility for both configurations.