An Aging-Robust 32MHz RC Frequency Reference With 0.4ppm Allan Deviation and ±1550ppm Inaccuracy From -40°C to 125°C After a 1-Point Trim
Sining Pan (Tsinghua University)
Xiaohan Liu (Beijing National Research Center for Information Science and Technology, Tsinghua University)
Junlong Zeng (Beijing National Research Center for Information Science and Technology)
Yihang Cheng (Beijing National Research Center for Information Science and Technology)
Kofi A.A. Makinwa (TU Delft - Microelectronics)
Huaqiang Wu (Beijing National Research Center for Information Science and Technology)
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Abstract
This letter presents an aging-robust 32MHz RC frequency reference based on a frequency-locked-loop (FLL). With a temperature compensation scheme that combines BJTs and aging-robust diffusion resistors, the FLL achieves ±1550ppm inaccuracy from -40°C to 125°C after batch calibration and a low-cost 1-point trim, which increases to ±2350ppm after accelerated aging. Due to the extensive use of dynamic error-correction techniques, the FLL also achieves a state-of-the-art Allan deviation floor of 0.4ppm.
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