Scaling behavior and parasitic series resistance in disordered organic field-effect transistors

Meijer, EJ; Gelinck, GH; van Veenendaal, E; Huisman, BH; de Leeuw, DM; Klapwijk, T.M.

Scaling behavior and parasitic series resistance in disordered organic field-effect transistors

Journal article (2003)

Authors

EJ Meijer QN/Fysics of NanoElectronics

GH Gelinck External organisation

E van Veenendaal External organisation

BH Huisman External organisation

DM de Leeuw External organisation

T.M. Klapwijk QN/Fysics of NanoElectronics

Research Group

QN/Fysics of NanoElectronics

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Published Date

2003

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Research Group

QN/Fysics of NanoElectronics

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