An Array of Bandpass Detectors for Measuring Beam Spectral Components
Mojtaba Jahangiri (TU Delft - Electronic Instrumentation)
Paolo Sberna (TU Delft - EKL Processing)
undefined Sammak (TU Delft - BUS/TNO STAFF, TU Delft - QuTech Advanced Research Centre, TNO)
Stoyan Nihtianova (TU Delft - Electronic Instrumentation)
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Abstract
A clear understanding of the spectral components of an irradiated beam, or captured optical emission, is essential to optimize an optical system and increase its performance. Logically, for this purpose a grating-based spectrometer could be the first choice. However, in the case of a wide range spectrum, and for radiation with one dominant wavelength, this option may not work well. In this paper, we present a technique based on an array of bandpass detectors to measure accurately the power of a number of beam-specific spectral components in a wide spectrum range: from soft X-ray to infrared. The main unique features of this technique are: customization for specific wavelengths of interest; vacuum compatibility; and high sensitivity to low-energy spectral components in the presence of one or more dominant highpower spectral components.