Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
W.I.L. Lawrie (TU Delft - QCD/Veldhorst Lab, Kavli institute of nanoscience Delft)
M. Russ (Kavli institute of nanoscience Delft, TU Delft - QCD/Vandersypen Lab)
Floor van Riggelen (Kavli institute of nanoscience Delft, TU Delft - QCD/Veldhorst Lab)
N. W. Hendrickx (TU Delft - QCD/Veldhorst Lab, Kavli institute of nanoscience Delft)
Sander L. De Snoo (Kavli institute of nanoscience Delft, TU Delft - QCD/Vandersypen Lab)
Amir Sammak (TU Delft - BUS/TNO STAFF)
G. Scappucci (TU Delft - QCD/Scappucci Lab, Kavli institute of nanoscience Delft)
J Helsen (Centrum Wiskunde & Informatica (CWI))
Menno Veldhorst (TU Delft - QN/Veldhorst Lab, Kavli institute of nanoscience Delft)
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Abstract
Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbor pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology.