Mimicking an Atomically Thin “Vacuum Spacer” to Measure the Hamaker Constant between Graphene Oxide and Silica
L. Chu (TU Delft - OLD ChemE/Organic Materials and Interfaces)
A.V. Korobko (TU Delft - OLD ChemE/Organic Materials and Interfaces)
A. Cao (TU Delft - OLD ChemE/Organic Materials and Interfaces)
S. Sachdeva (TU Delft - OLD ChemE/Organic Materials and Interfaces)
Z. Liu (TU Delft - OLD ChemE/Organic Materials and Interfaces)
LCPM de Smet (TU Delft - OLD ChemE/Organic Materials and Interfaces)
EJR Sudhölter (TU Delft - OLD ChemE/Organic Materials and Interfaces)
Stephen J. Picken (TU Delft - ChemE/Advanced Soft Matter)
N. A.M. Besseling (TU Delft - OLD ChemE/Organic Materials and Interfaces)
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Abstract
The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.