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Journal article (2017)

Authors

L. Chu OLD ChemE/Organic Materials and Interfaces
A.V. Korobko OLD ChemE/Organic Materials and Interfaces
A. Cao OLD ChemE/Organic Materials and Interfaces
S. Sachdeva OLD ChemE/Organic Materials and Interfaces
Z. Liu OLD ChemE/Organic Materials and Interfaces
L.C.P.M. de Smet OLD ChemE/Organic Materials and Interfaces
Ernst J. R. Sudhölter OLD ChemE/Organic Materials and Interfaces
S.J. Picken ChemE/Advanced Soft Matter - AS
N.A.M. Besseling OLD ChemE/Organic Materials and Interfaces
Research Group
OLD ChemE/Organic Materials and Interfaces
Copyright: © 2017 L. Chu, A.V. Korobko, A. Cao, S. Sachdeva, Z. Liu, L.C.P.M. de Smet, Ernst J. R. Sudhölter, S.J. Picken, N.A.M. Besseling
DOI
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https://doi.org/10.1002/admi.201600495
Atomic force microscopy 2D materials Graphene oxide Hamaker constant Vacuum spacers
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Published Date

2017

Language

English

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Research Group

OLD ChemE/Organic Materials and Interfaces

Abstract

The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.