Mimicking an Atomically Thin "Vacuum Spacer" to Measure the Hamaker Constant between Graphene Oxide and Silica
L. Chu (OLD ChemE/Organic Materials and Interfaces)
A.V. Korobko (OLD ChemE/Organic Materials and Interfaces)
A. Cao (OLD ChemE/Organic Materials and Interfaces)
Sumit Sachdeva (OLD ChemE/Organic Materials and Interfaces)
Zhen Liu (OLD ChemE/Organic Materials and Interfaces)
Louis C P M de Smet (OLD ChemE/Organic Materials and Interfaces)
E.J.R. Sudhölter (OLD ChemE/Organic Materials and Interfaces)
S.J. Picken (TU Delft - ChemE/Advanced Soft Matter)
N. A.M. Besseling (OLD ChemE/Organic Materials and Interfaces)
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Abstract
The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.