ZL
Z. Liu
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1 records found
1
Journal article
(2017)
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Liangyong Chu, A.V. Korobko, Anping Cao, Sumit Sachdeva, Zhen Liu, Louis C P M de Smet, E.J.R. Sudholter, Stephen J. Picken, Nicolaas A M Besseling
The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.
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The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.