In multi electron beam systems, “Neighbours Matter”
A. Mohammadi Gheidari (Thermo Fisher Scientific, TU Delft - ImPhys/Hoogenboom group)
E. R. Kieft (Thermo Fisher Scientific)
X. Guo (TU Delft - ImPhys/Hoogenboom group)
M. Wisse (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)
Pieter Kruit (TU Delft - ImPhys/Hoogenboom group)
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Abstract
In the Multi beam source (MBS) of our Multi Beam Scanning Electron Microscope (MBSEM), an aperture lens array (ALA) splits the emission cone of the Schottky field emitter into multiple beamlets. When the apertures in the ALA are close to each other, the ALA can introduce aberrations to these beamlets through the electrostatic interaction of neighbouring apertures with each aperture's lens field. When the apertures are arranged in a square grid pattern, the aberration causes fourfold astigmatism. The effect on the beam spot is analyzed through a combination of 3D simulations and experimental validation. To counterbalance the fourfold astigmatism, a correction scheme is proposed in which a slightly non-round profile is applied to the aperture lenses.
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