A ±36-A Integrated Current-Sensing System with a 0.3% Gain Error and a 400-μA Offset From-55 °c to +85 °c

Journal article (2017)

Authors

S. Heidary Shalmany Electronic Instrumentation - EEMCS
D. Draxelmayr Infineon Technologies
K.A.A. Makinwa Microelectronics
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
Copyright: © 2017 S. Heidary Shalmany, Dieter Draxelmayr, K.A.A. Makinwa
DOI: https://doi.org/10.1109/JSSC.2016.2639535
Temperature sensor Temperature compensation Dynamic bandgap reference (BGR) Current-sensing system (CSS) Lead frame shunt resistor
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Published Date

2017

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

This paper presents an integrated shunt-based current-sensing system (CSS) capable of handling ±36-A currents, the highest ever reported. It also achieves a 0.3% gain error and a 400-μA offset, which is significantly better than the state-of-the-art systems. The heart of the system is a robust 260-μ Ω shunt resistor made from the lead frame of a standard HVQFN plastic package. The resulting voltage drop is then digitized by a precision Δ Σ ADC and a bandgap reference (BGR). At the expense of current handling capability, a ±5-A version of the CSS uses a 10-mΩ on-chip metal shunt to achieve just a 4-μ A offset. Both designs are realized in a standard 0.13-μm CMOS process and draw 13 μA from a 1.5-V supply. Compensation of the spread and nonlinear temperature dependency of the shunt resistor Rshunt is accomplished by the use of a fixed polynomial master curve and a single room temperature calibration. This procedure also effectively compensates for the residual spread and nonlinearity of the ADC and the BGR.