Print Email Facebook Twitter Exploiting evanescent-wave amplification for subwavelength low-contrast particle detection Title Exploiting evanescent-wave amplification for subwavelength low-contrast particle detection Author Roy, S. (TU Delft ImPhys/Optics) Pereira, S.F. (TU Delft ImPhys/Optics) Urbach, Paul (TU Delft ImPhys/Optics) Wei, X. (TU Delft ImPhys/Optics) El Gawhary, O. (TU Delft ImPhys/Optics; VSL Dutch Metrology Institute) Date 2017 Abstract The classical problem of subwavelength particle detection on a flat surface is especially challenging when the refractive index of the particle is close to that of the substrate. We demonstrate a method to improve the detection ability several times for such a situation, by enhancing the "forbidden" evanescent waves in the substrate using the principle of super-resolution with evanescent waves amplification. The working mechanism of the system and experimental validation from a design with a thin single dielectric layer is presented. The resulting system is a simple but complete example of evanescent-wave generation, amplification, and the consequent modulation of the far field. This principle can have far reaching impact in the field of particle detection in several applications ranging from contamination control to interferometric scattering microscopy for biological samples. To reference this document use: http://resolver.tudelft.nl/uuid:a76be3b2-28ac-4fb8-ab5d-6c9228248671 DOI https://doi.org/10.1103/PhysRevA.96.013814 ISSN 1050-2947 Source Physical Review A (Atomic, Molecular and Optical Physics), 96 (1) Part of collection Institutional Repository Document type journal article Rights © 2017 S. Roy, S.F. Pereira, Paul Urbach, X. Wei, O. El Gawhary Files PDF PhysRevA.96.013814.pdf 864.93 KB Close viewer /islandora/object/uuid:a76be3b2-28ac-4fb8-ab5d-6c9228248671/datastream/OBJ/view