Print Email Facebook Twitter A comprehensive model for transient behavior of tapping mode atomic force microscope Title A comprehensive model for transient behavior of tapping mode atomic force microscope Author Keyvani Janbahan, A. (TU Delft Computational Design and Mechanics; TNO) Tamer, M.S. (TU Delft Computational Design and Mechanics; TNO) van Wingerden, J.W. (TU Delft Team Jan-Willem van Wingerden) Goosen, J.F.L. (TU Delft Computational Design and Mechanics) van Keulen, A. (TU Delft Computational Design and Mechanics) Date 2019 Abstract Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode atomic force microscopy (TM-AFM). However, a transient dynamic model—which is essential for a model-based control design—is still missing. In this paper, we derive a mathematical model which covers both the transient and steady-state behavior. The steady-state response of the proposed model has been validated with existing theories. Its transient response, however, which is not covered with existing theories, has been successfully verified with experiments. Besides enabling model-based control design for TM-AFM, this model can explain the high-end aspects of AFM such as speed limitation, image quality, and eventual chaotic behavior. Subject ChaosModulated modelSpeed limit of AFMTapping mode AFMTransient analysis To reference this document use: http://resolver.tudelft.nl/uuid:f88bca2a-9814-4cb3-bc55-b587b180c4e8 DOI https://doi.org/10.1007/s11071-019-05079-2 ISSN 0924-090X Source Nonlinear Dynamics: an international journal of nonlinear dynamics and chaos in engineering systems, 97 (2), 1601-1617 Part of collection Institutional Repository Document type journal article Rights © 2019 A. Keyvani Janbahan, M.S. Tamer, J.W. van Wingerden, J.F.L. Goosen, A. van Keulen Files PDF Keyvani2019_Article_AComp ... ansien.pdf 3.64 MB Close viewer /islandora/object/uuid:f88bca2a-9814-4cb3-bc55-b587b180c4e8/datastream/OBJ/view