Print Email Facebook Twitter Long-Term Temperature-Dependent Degradation of 175 W Chip-on-Board LED Modules Title Long-Term Temperature-Dependent Degradation of 175 W Chip-on-Board LED Modules Author Herzog, Alexander (Technische Universität Darmstadt) Wagner, Max (Technische Universität Darmstadt) Benkner, Simon (Technische Universität Darmstadt) Zandi, Babak (Technische Universität Darmstadt) van Driel, W.D. (TU Delft Electronic Components, Technology and Materials) Khanh, Tran Quoc (Technische Universität Darmstadt) Date 2022 Abstract We report on the degradation dynamics and mechanisms of the commercially available chip-on-board (COB) high-power light-emitting diode (LED) modules with an electrical power of 175 W. Due to the associated thermal load, the temperature dependence of the aging processes is additionally analyzed within the scope of this work. The aging tests were performed for a period of 6000 h at four different case temperatures between 55 °C and 120 °C. The results of the accelerated stress tests indicate a temperature-Activated aging process, which severely limits the lifetime of the modules. In addition, the following key findings can be reported: 1) a significant decrease in optical power occurs within 6000 h of operation; 2) depending on the stress test condition the accompanying color shifts exceed a limit of $\Delta {u}\,'{v}\,'={0}.{007}$ ; and 3) the limiting degradation mechanism can be attributed to the package of the device and can be accelerated with temperature, current, and chemicals. Reported findings can be manifested by additional optical material inspections, allowing to use the results for optimizations of future module generations. Subject Accelerated agingAg mirror corrosionchip-on-board (COB)color shifthigh-power LEDLED moduleslight-emitting diodes (LEDs)reliability To reference this document use: http://resolver.tudelft.nl/uuid:1bc1aa1b-963a-406a-97a4-424de9289387 DOI https://doi.org/10.1109/TED.2022.3214169 Embargo date 2023-04-24 ISSN 0018-9383 Source IEEE Transactions on Electron Devices, 69 (12), 6830-6836 Bibliographical note Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. Part of collection Institutional Repository Document type journal article Rights © 2022 Alexander Herzog, Max Wagner, Simon Benkner, Babak Zandi, W.D. van Driel, Tran Quoc Khanh Files PDF Long_Term_Temperature_Dep ... odules.pdf 1.94 MB Close viewer /islandora/object/uuid:1bc1aa1b-963a-406a-97a4-424de9289387/datastream/OBJ/view