Print Email Facebook Twitter Modeling Soft-Error Reliability Under Variability Title Modeling Soft-Error Reliability Under Variability Author Balakrishnan, Aneesh (IROC Technologies) Cardoso Medeiros, G. (TU Delft Computer Engineering) Cem Gursoy, Cemil (Tallinn University of Technology) Hamdioui, S. (TU Delft Quantum & Computer Engineering) Jenihhin, Maksim (Tallinn University of Technology) Alexandrescu, Dan (IROC Technologies) Department Quantum & Computer Engineering Date 2021 Abstract The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in deep submicron technologies are characterized as the major critical issues of high-performance integrated circuits. The previous scientific research studies provide a comprehensive description that the soft-error vulnerability becomes more severe as the circuit performance degrades with aging. The main reason is the reduction of cell-level critical charge in an aging environment. However, such increased soft-error generation does not necessarily contribute towards circuits' critical functional failures. The proposal of this paper is the experimental investigation of soft error propagation at the aged gate-level by considering the different derating factors like Electrical Derating (EDR), Temporal Derating (TDR), Logical Derating (LDR), and Functional Derating (FDR). As contrary to the previous studies, the results of this work prove that SEU fault propagation probability is reducing in critical paths as time advances while the propagation probability of SET faults is neither reducing nor increasing, but the spot of generation of failure enhancing SETs is shifting within the clock period. Subject NBTIStandard Delay FormatSingle Event UpsetSingle Event Transient To reference this document use: http://resolver.tudelft.nl/uuid:7872dd42-8c63-463c-9f9d-ce21afd208c2 DOI https://doi.org/10.1109/DFT52944.2021.9568295 Publisher IEEE ISBN 978-1-6654-1609-2 Source 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Event 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021-10-06 → 2021-10-08, Online, Athens, Greece Part of collection Institutional Repository Document type conference paper Rights © 2021 Aneesh Balakrishnan, G. Cardoso Medeiros, Cemil Cem Gursoy, S. Hamdioui, Maksim Jenihhin, Dan Alexandrescu Files PDF DFTS2021_SOFT_AGING.pdf 2.19 MB Close viewer /islandora/object/uuid:7872dd42-8c63-463c-9f9d-ce21afd208c2/datastream/OBJ/view