Print Email Facebook Twitter Thermal Management on IGBT Power Electronic Devices and Modules Title Thermal Management on IGBT Power Electronic Devices and Modules Author Qian, C. (Beihang University) Mirza Gheytaghi, Amir (TU Delft Electronic Components, Technology and Materials) Fan, J. (Hohai University; Changzhou Institute of Technology Research for Solid State Lighting) Tang, H. (TU Delft Electronic Components, Technology and Materials; Changzhou Institute of Technology Research for Solid State Lighting) Sun, B. (TU Delft Electronic Components, Technology and Materials; Changzhou Institute of Technology Research for Solid State Lighting) Ye, H. (TU Delft Electronic Components, Technology and Materials; Chongqing University) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials; Chinese Academy of Sciences) Date 2018 Abstract As an increasing attention towards sustainable development of energy and environment, the power electronics (PEs) are gaining more and more attraction on various energy systems. The insulated gate bipolar transistor (IGBT), as one of the PEs with numerous advantages and potentials for development of higher voltage and current ratings, has been used in a board range of applications. However, the continuing miniaturization and rapid increasing power ratings of IGBTs have remarkable high heat flux, which requires complex thermal management. In this paper, studies of the thermal management on IGBTs are generally reviewed including analyzing, comparing, and classifying the results originating from these researches. The thermal models to accurately calculate the dynamic heat dissipation are divided into analytical models, numerical models, and thermal network models, respectively. The thermal resistances of current IGBT modules are also studied. According to the current products on a number of IGBTs, we observe that the junction-to-case thermal resistance generally decreases inversely in terms of the total thermal power. In addition, the cooling solutions of IGBTs are reviewed and the performance of the various solutions are studied and compared. At last, we have proposed a quick and efficient evaluation judgment for the thermal management of the IGBTs depended on the requirements on the junction-to-case thermal resistance and equivalent heat transfer coefficient of the test samples. Subject Power electronicsIGBTthermal managementcoolingqualificationsOA-Fund TU Delft To reference this document use: http://resolver.tudelft.nl/uuid:e303d23c-9a89-4d58-8dc3-1115e7efc030 DOI https://doi.org/10.1109/ACCESS.2018.2793300 ISSN 2169-3536 Source IEEE Access, 6, 12868-12884 Part of collection Institutional Repository Document type journal article Rights © 2018 C. Qian, Amir Mirza Gheytaghi, J. Fan, H. Tang, B. Sun, H. Ye, Kouchi Zhang Files PDF 46643090_08258946.pdf 13.1 MB Close viewer /islandora/object/uuid:e303d23c-9a89-4d58-8dc3-1115e7efc030/datastream/OBJ/view