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Rectification in Ionic Field Effect Transistors Based on Single Crystal Silicon Nanopore
Correction: Study on the controllability of the fabrication of single-crystal silicon nanopores/nanoslits with a fast-stop ionic current-monitored TSWE method (Microsystems & Nanoengineering, (2023), 9, 1, (63), 10.1038/s41378-023-00532-0)
Study on the controllability of the fabrication of single-crystal silicon nanopores/nanoslits with a fast-stop ionic current-monitored TSWE method
MEMS enabled fast time-resolved X-ray diffraction characterization platform for copper nanoparticle sintering in heterogeneous integration applications
Stretchable Binary Fresnel Lens for Focus Tuning
Single-Mask Fabrication of Temperature Triggered MEMS Switch for Cooling Control in SSL System
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