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Announcing TU Delft Repository replacement
On
2 July 2024
TU Delft Repository will be replaced with a fresh user friendly design with monthly new feature releases.
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Defects, Fault Modeling, and Test Development Framework for RRAMs
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Hard-to-Detect Fault Analysis in FinFET SRAMs
Defect and Fault Modeling Framework for STT-MRAM Testing
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