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El Gawhary, O. (author), Kumar, N. (author), Pereira, S.F. (author), Coene, W.M.J. (author), Urbach, H.P. (author)
Scatterometry is a well established technique currently utilized in research, as well as in industrial applications, to retrieve the properties of a given scatterer (the target) by looking at how the light coming from a certain source is diffracted in the far field. Currently the light source is often a discharge lamp that, after wavelength...
journal article 2011