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Defects, Fault Modeling, and Test Development Framework for RRAMs
Hard-to-Detect Fault Analysis in FinFET SRAMs
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Defect and Fault Modeling Framework for STT-MRAM Testing
Device-Aware Test: A New Test Approach Towards DPPB Level
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