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Defects, Fault Modeling, and Test Development Framework for RRAMs
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design
Hard-to-Detect Fault Analysis in FinFET SRAMs
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Impact of Magnetic Coupling and Density on STT-MRAM Performance
Defect and Fault Modeling Framework for STT-MRAM Testing
Device-Aware Test: A New Test Approach Towards DPPB Level
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