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Sadeghian, H. (author), Yang, C.K. (author), Bossche, A. (author), French, P.J. (author), Goosen, J.F.L. (author), Van Keulen, A. (author)A method for determining a spring constant k for a deformable probe element (102) of a scanning probe microscope SPM (100). The probe (102) has an outer surface area consisting of a tip area (112) on a first probe side (108) and a tip-less area (113). The probe (102) also has a probe electrode (114) and a scanning probe tip (104) in the tip area...patent 2012
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Bossche, A. (author), Kutchoukov, V.G. (author), Garini, Y. (author), Young, I.A. (author)The invention relates to a titre plate for chemical and/or biochemical analysis based on an illumination measurement comprising a transparent substrate, applied to the substrate there is a metallic layer, which is provided with an array of reaction chambers, wherein the reaction chambers extend from the top side of the metallic layer to, or into...patent 2006
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Iordanov, V. (author), Bastemeijer, J. (author), Bossche, A. (author), Sarro, P.M. (author)A device for carrying out a reaction, which device comprises a wafer provided with a group of at least two wells. The wells are thermally separate from each other by means of a groove in a layer of the device, while parts separated by the groove are locally connected by bridges. In this way a device is provided combining great mechanical...patent 2005
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Kutchoukov, V.G. (author), Bossche, A. (author), Laugere, F. (author), Van der Vlist, W. (author)The present invention relates to a method of fabricating at least one nanochannel in a semiconductor material applied on a substrate, comprising t he semiconductor material being subjected to an etching treatment and said substrate to a bonding treatment so as to attach a covering layer to the substrate, in which bonding treatment the...patent 2005