Skip to main content
TudRepo
Research repository
Education Repository
Cultural Heritage
About
·
How to search
·
How to upload
Include full text
Search results
Back
Searched for: +
(1 - 20 of 27)
Document type
Date
Pages
1
2
List view
Grid view
Print
Email
export CSV
export Excel
Electromigration-induced local dewetting in Cu films
Effect of Passivation and Mechanical Constraint on Electromigration in Interconnect
Implementation of Fully Coupled Electromigration Theory in COMSOL
Effect of Thermomigration on Electromigration in SWEAT Structures
Interfacial properties of Cu/SiO2 using a multiscale modelling approach in electronic packages
Implementation of General Coupling Model of Electromigration in ANSYS
Interfacial Failure Characterization of Electronic Packaging Component Using a Multiscale Modelling Approach
Multi-parameters optimization for electromigration in WLCSP solder bumps
Al(OH)3 facilitated synthesis of water-soluble, magnetic, radiolabelled and fluorescent hydroxyapatite nanoparticles
Numerical simulation on the mechanical characteristics of double-stranded DNA under axial stretching and lateral unzipping
Effects of temperature and grain size on diffusivity of aluminium: electromigration experiment and molecular dynamic simulation
The effect of riboflavin on the microbiologically influenced corrosion of pure iron by Shewanella oneidensis MR-1
Adaptive bidirectional extracellular electron transfer during accelerated microbiologically influenced corrosion of stainless steel
Vanadium-Containing Chloroperoxidase-Catalyzed Versatile Valorization of Phenols and Phenolic Acids
Effects of Defect and Temperature on the Mechanical Performance of WS
2
: A Multiscale Analysis
Sulfur-Rich Ageing Mechanism of Silicone Encapsulant Used in LED Packaging: An Experimental and Molecular Dynamic Simulation Study
Directed evolution of phosphite dehydrogenase to cycle noncanonical redox cofactors via universal growth selection platform
Chemoenzymatic Hunsdiecker-Type Decarboxylative Bromination of Cinnamic Acids
A stochastic process based reliability prediction method for LED driver
The interface adhesion of CaAlSiN
3
: Eu
2+
phosphor/silicone used in light-emitting diode packaging: A first principles study
Searched for: +
(1 - 20 of 27)
Document type
Date
Pages
1
2
List view
Grid view
Print
Email
export CSV
export Excel