Development and application of ultrafast scanning electron microscopy

Scanning electron microscopes (SEMs) can capture detail on the single nanometer length scale through the interaction of a tightly focused electron beam with a sample, but this impressive spatial resolution is not matched with a capability to resolve dynamic processes on the ultrafast time scale. A variety of processes occur at nanosecond and...

Imaging resonant micro-cantilever movement with ultrafast scanning electron microscopy

Here, we demonstrate ultrafast scanning electron microscopy (SEM) for making ultrafast movies of mechanical oscillators at resonance with nanoscale spatiotemporal resolution. Locking the laser excitation pulse sequence to the electron probe pulses allows for video framerates over 50 MHz, well above the detector bandwidth, while maintaining...

Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution

Ultrafast scanning electron microscopy images carrier dynamics and carrier induced surface voltages using a laser pump electron probe scheme, potentially surpassing all-optical techniques in probe resolution and surface sensitivity. Current implementations have left a four order of magnitude gap between optical pump and electron probe...

Beam displacement and blur caused by fast electron beam deflection

Electrostatic beam blankers are an alternative to photo-emission sources for generating pulsed electron beams for Time-resolved Cathodoluminescence and Ultrafast Electron Microscopy. While the properties of beam blankers have been extensively investigated in the past for applications in lithography, characteristics such as the influence of...

Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping

Visualizing charge carrier flow over interfaces or near surfaces meets great challenges concerning resolution and vastly different time scales of bulk and surface dynamics. Ultrafast or four-dimensional scanning electron microscopy (USEM) using a laser pump electron probe scheme circumvents the optical diffraction limit, but disentangling...

Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy

Nanomaterials can be identified in high-resolution electron microscopy images using spectrally-selective cathodoluminescence. Capabilities for multiplex detection can however be limited, e.g., due to spectral overlap or availability of filters. Also, the available photon flux may be limited due to degradation under electron irradiation. Here,...

Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states

We show cathodoluminescence-based time-resolved electron beam spectroscopy in order to directly probe the spontaneous emission decay rate that is modified by the local density of states in a nanoscale environment. In contrast to dedicated laser-triggered electron-microscopy setups, we use commercial hardware in a standard SEM, which allows us to...

Onderzoek naar effecten van stopzetting grondwateronttrekking DSM Delft: Fase 1: Monitoringstrategie voor grondwaterstijging, waterkwaliteit en geotechniek - Hoofdrapport

Delft en omliggende gemeenten zullen in de komende jaren moeten anticiperen op de mogelijke veranderingen in het onttrekkingsregime voor grondwater van DSM Gist en de geplande aanleg van de spoortunnel onder Delft. Deze veranderingen hebben invloed op het watersysteem en daarmee op het waterbeheer. In het kader van het onderzoeksprogramma ...