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Yazdan Mehr, M. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
In this chapter, degradation mechanisms of optical materials, used in the light-emitting diode (LED)-based products, are explained. This chapter aims at describing the service conditions on the degradation mechanisms of different organic optical materials in LEDs which lead to the color shift of the light output. The contributions of different...
book chapter 2022
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van Driel, W.D. (author), Yazdan Mehr, M. (author), Fan, X. J. (author), Zhang, Kouchi (author)
In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we...
book chapter 2022
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el Mansouri, B. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Nowadays many applications require optical detection of some sorts, ranging from civil to military fields. Depending on the optical source, each sensing element needs to have distinct properties with the spectral range at the top. Choices such as sensitivity and environment play an equally important role, if not more important. The properties of...
book chapter 2020
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Middelburg, L.M. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
In the coming decade, the development in the area of More than Moore will certainly take over from Moore’s Law. Sensor development and sensor integration will prevail above lower node development. New packaging solutions will be developed which will fuel the integration of sensors. These developments can still be silicon based but where harsh...
book chapter 2020
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Van Der Sluis, Olaf (author), Iwamoto, Nancy (author), Qu, Jianmin (author), Yang, Shaorui (author), Yuan, C.A. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Adhesion and delamination have been pervasive problems hampering the performance and reliability of micro-and nano-electronic devices. In order to understand, predict, and ultimately prevent interface failure in electronic devices, development of accurate, robust, and efficient delamination testing and prediction methods is crucial. Adhesion...
book chapter 2018
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Yazdan Mehr, M. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems. It originates from the degradation of the different components within the system, including the chip, the driver, and the optical materials (i.e., phosphorous layer). The kinetics of degradation in real-life applications is relatively slow, and in most...
book chapter 2018
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