Malinowski, F.K. (author), Han, L. (author), de Jong, D. (author), Wang, Ji Yin (author), Prosko, C.G. (author), Krogstrup, Peter (author), Bakkers, Erik P.A.M. (author), Kouwenhoven, Leo P. (author), Koski, Jonne V. (author) We demonstrate the use of radio-frequency (rf) resonators to measure the capacitance of nanoscale semiconducting devices in field-effect transistor configurations. The rf resonator is attached to the gate or the lead of the device. Consequently, tuning the carrier density in the conducting channel of the device affects the resonance frequency...
journal article 2022
