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Superconducting transition metal nitride films for THz SIS mixers
Texture-related roughness of (Nb,Ti)N sputter-deposited films
Analysis of the fabrication process of Nb/Al-AlN/sub x//Nb tunnel junctions with low R/sub n/A values for SIS mixers
Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors
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