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Hinsdale, T.A. (author), Stallinga, S. (author), Rieger, B. (author)
Structured illumination microscopy (SIM) is a widely used imaging technique that doubles the effective resolution of widefield microscopes. Most current implementations rely on diffractive elements, either gratings or programmable devices, to generate structured light patterns in the sample. These can be limited by spectral efficiency, speed, or...
journal article 2021