Eroms, J. (author), Van Schaarenburg, L.C. (author), Driessen, E.F.C. (author), Plantenberg, J.H. (author), Huizinga, C.M. (author), Schouten, R.N. (author), Verbruggen, A.H. (author), Harmans, C.J.P.M. (author), Mooij, J.E. (author) The authors have studied low-frequency resistance fluctuations in shadow-evaporated Al/AlOx/Al tunnel junctions. Between 300 and 5?K the spectral density follows a 1/f law. Below 5?K, individual defects distort the 1/f shape of the spectrum. The spectral density decreases linearly with temperature between 150 and 1?K and saturates below 0.8?K....
journal article 2006
