document

InP-based spotsize converter for integration with switching devices

Stulemeijer, J. (author), Bakker, A.F. (author), Moerman, I. (author), Groen, F.H. (author), Smit, M.K. (author)

journal article 1999

document

Experiences with digital analysis of discharges in high voltage components

Gulski, E. (author), Smit, J.J. (author), Brooks, R. (author), Turner, M. (author)

journal article 1999

document

Minimization of the loss of intersecting waveguides in InP-based photonic integrated circuits

Bukkems, H.G. (author), Herben, C.G.P. (author), Smit, M.K. (author), Groen, F.H. (author), Moerman, I. (author)

journal article 1999

document

Polarization independent dilated WDM cross-connect on InP

Herben, C.G.P. (author), Maat, D.H.P. (author), Leijtens, X.J.M. (author), Leys, M.R. (author), Oei, Y.S. (author), Smit, M.K. (author)

journal article 1999

document

Crosstalk performance of integrated optical cross-connects

Herben, C.G.P. (author), Leijtens, X.J.M. (author), Maar, P. (author), Blok, H. (author), Smit, M.K. (author)

journal article 1999

document

Second World Congress on Safety of Transportation, 18-20 February 1998, proceedings imbalance between growth and safety?

Hengst, S. (author), Smit, K. (author), Stoop, J.A. (author)

book 1999

document

Advanced partial discharge diagnostic of MV power cable system using oscillating wave test system

Gulski, E. (author), Wester, F.J. (author), Smit, J.J. (author), Seitz, P.N. (author), Turner, M. (author)

journal article 2000

document

Fundamental aspects of PD patterns of on-line measurements on turbogenerators

Zondervan, J.P. (author), Gulski, E. (author), Smit, J.J. (author)

journal article 2000

document

Monitoring and diagnostic of transformer solid insulation

van Bolhuis, J.P. (author), Gulski, E. (author), Smit, J.J. (author)

journal article 2002

document

Low-loss, compact, and polarization independent PHASAR demultiplexer fabricated by using a double-etch process

den Besten, J.H. (author), Dessens, M.P. (author), Herben, C.G.P. (author), Leijtens, X.J.M. (author), Groen, F.H. (author), Leys, M.R. (author), Smit, M.K. (author)

journal article 2002

document

Standardization of on-line VHF PD measurements on turbo generators

van Breen, H.J. (author), Gulski, E. (author), Smit, J.J. (author), Verhaart, H.F.A. (author), de Leeuw, W. (author), Krieg-Wezelenburg, M. (author)

journal article 2002

document

Enhanced tunneling across nanometer-scale metal–semiconductor interfaces

Smit, G.D.J. (author), Rogge, S. (author), Klapwijk, T.M. (author)

We have measured electrical transport across epitaxial, nanometer-sized metal–semiconductor interfaces by contacting CoSi2 islands grown on Si(111) with the tip of a scanning tunneling microscope. The conductance per unit area was found to increase with decreasing diode area. Indeed, the zero-bias conductance was found to be ? 104 times larger...

journal article 2002

document

Scaling of nano-Schottky-diodes

Smit, G.D.J. (author), Rogge, S. (author), Klapwijk, T.M. (author)

A generally applicable model is presented to describe the potential barrier shape in ultrasmall Schottky diodes. It is shown that for diodes smaller than a characteristic length lc (associated with the semiconductor doping level) the conventional description no longer holds. For such small diodes the Schottky barrier thickness decreases with...

journal article 2002

document

Gate-induced ionization of single dopant atoms

Smit, G.D.J. (author), Rogge, S. (author), Caro, J. (author), Klapwijk, T.M. (author)

journal article 2003

document

Group-theoretical analysis of double acceptors in a magnetic field: Identification of the Si:B+ ground state

Smit, G.D.J. (author), Rogge, S. (author), Caro, J. (author), Klapwijk, T.M. (author)

journal article 2004

document

Stark effect in shallow impurities in Si

Smit, G.D.J. (author), Rogge, S. (author), Caro, J. (author), Klapwijk, T.M. (author)

journal article 2004

document

Conductance distribution in nanometer-sized semiconductor devices due to dopant statistics

Smit, G.D.J. (author), Rogge, S. (author), Caro, J. (author), Klapwijk, T.M. (author)

journal article 2004

document

Direct observation by resonant tunneling of the B+ level in a o-doped silicon barrier

Caro, J. (author), Vink, I.D. (author), Smit, G.D.J. (author), Rogge, S. (author), Klapwijk, T.M. (author), Loo, R. (author), Caymax, M. (author)

journal article 2004

document

Atomic-scale electronics in semiconductors

Smit, G.D.J. (author)

A dopant atom in a semiconductor, the solid state analogue of a hydrogen atom, has a Bohr radius of several nanometers. Because this length scale is close to being accessible by modern nanolithography, detection and control of charge and spin in a semiconductor down to the level of individual dopant atoms is within reach and provides the unique...

doctoral thesis 2004

document

Partial discharges at DC voltage: Their mechanism, detection and analysis

Morshuis, P.H.F. (author), Smit, J.J. (author)

journal article 2005