Skip to main content
TudRepo
Research repository
Education Repository
Cultural Heritage
About
·
How to search
·
How to upload
Include full text
Search results
Back
Searched for: %2520
(1 - 4 of 4)
Document type
Date
List view
Grid view
Print
Email
export CSV
export Excel
Electron-beam patterned calibration structures for structured illumination microscopy
Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
Structured illumination microscopy with noise-controlled image reconstructions
Retarding Field Integrated Fluorescence and Electron Microscope
Searched for: %2520
(1 - 4 of 4)
Document type
Date
List view
Grid view
Print
Email
export CSV
export Excel