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Correction: Study on the controllability of the fabrication of single-crystal silicon nanopores/nanoslits with a fast-stop ionic current-monitored TSWE method (Microsystems & Nanoengineering, (2023), 9, 1, (63), 10.1038/s41378-023-00532-0)
Study on the controllability of the fabrication of single-crystal silicon nanopores/nanoslits with a fast-stop ionic current-monitored TSWE method
Nanoprobes for PET/MR Imaging
Supplementary control based on current source coupling for improving dynamic characteristics of active distribution network
A silicon MEMS structure for characterization of femto-farad-level capacitive sensors with lock-in architecture
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