Searched for: %2520
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document
Sattari, R. (author), van Zeijl, H.W. (author), Zhang, Kouchi (author)
This paper focuses on the design and fabrication of a new programmable thermal test chip as a flexible and cost-effective solution for simplification of characterization/prototyping of new packages. The cell-based design format makes the chip fit into any modular array configuration. One unit cell is as small as 4x4 mm2, including 6 individually...
conference paper 2021
document
Heida, J.H. (author)
This report describes the concept of reliability of nondestructive inspection (NDI) and reviews the different aspects involved. First, the probability of detection (POD) of flaws in flawed specimens is discussed. To provide a measure of confidence in an estimated POD, lower botind values of this probability at a given confidence level are...
report 1984