Searched for: author%3A%22Chandrashekar%2C+A.%22
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Belardinelli, P. (author), Chandrashekar, A. (author), Alijani, F. (author), Lenci, Stefano (author)
This study examines the nonlinear dynamics in tapping-mode atomic force microscopy (AFM) with tip-surface interactions that include van der Waals and Derjaguin-Muller- € Toporov contact forces. We investigate the periodic solutions of the hybrid system by performing numerical pseudo-arclength continuation. Through the use of bifurcation locus...
journal article 2023
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Chandrashekar, A. (author)
Most physical phenomena be it mechanical, chemical or biological are inherently nonlinear in nature. In fact, it is the linear phenomenon that is the exception rather than the rule. By harnessing these nonlinearities one can obtain far greater information about the underlying physics and develop more sensitive and efficient devices. This is...
doctoral thesis 2022
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Belardinelli, P. (author), Chandrashekar, A. (author), Wiebe, R. (author), Alijani, F. (author), Lenci, S. (author)
Modal interactions are pervasive effects that commonly emerge in nanomechanical systems. The coupling of vibrating modes can be leveraged in many ways, including to enhance sensing or to disclose complex phenomenologies. In this work we show how machine learning and data-driven approaches could be used to capture intermodal coupling. We...
journal article 2022
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Chandrashekar, A. (author), Givois, A.P.P. (author), Belardinelli, P. (author), Penning, Casper L. (author), Aragon, A.M. (author), Staufer, U. (author), Alijani, F. (author)
Quantifying the nanomechanical properties of soft-matter using multi-frequency atomic force microscopy (AFM) is crucial for studying the performance of polymers, ultra-thin coatings, and biological systems. Such characterization processes often make use of cantilever's spectral components to discern nanomechanical properties within a multi...
journal article 2022
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Chandrashekar, A. (author), Belardinelli, P. (author), Bessa, M.A. (author), Staufer, U. (author), Alijani, F. (author)
Dynamic atomic force microscopy (AFM) is a key platform that enables topological and nanomechanical characterization of novel materials. This is achieved by linking the nanoscale forces that exist between the AFM tip and the sample to specific mathematical functions through modeling. However, the main challenge in dynamic AFM is to quantify...
journal article 2022
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Chandrashekar, A. (author), Belardinelli, P. (author), Lenci, Stefano (author), Staufer, U. (author), Alijani, F. (author)
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomechanical mapping of materials with atomic resolution. In this work, we develop an experimental procedure for increasing the sensitivity of higher harmonics of an atomic-force-microscope cantilever without modifying the cantilever geometry but...
journal article 2021
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Chandrashekar, A. (author), Belardinelli, P. (author), Staufer, U. (author), Alijani, F. (author)
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of...
journal article 2019
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Dolleman, R.J. (author), Houri, S. (author), Chandrashekar, A. (author), Alijani, F. (author), van der Zant, H.S.J. (author), Steeneken, P.G. (author)
In the field of nanomechanics, parametric excitations are of interest since they can greatly enhance sensing capabilities and eliminate cross-talk. Above a certain threshold of the parametric pump, the mechanical resonator can be brought into parametric resonance. Here we demonstrate parametric resonance of suspended single-layer graphene...
journal article 2018
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