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Searched for: author%3A%22Iosad%2C+N.N.%22
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Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors
Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors
Texture-related roughness of (Nb,Ti)N sputter-deposited films
Analysis of the fabrication process of Nb/Al-AlN/sub x//Nb tunnel junctions with low R/sub n/A values for SIS mixers
Superconducting transition metal nitride films for THz SIS mixers
Searched for: author%3A%22Iosad%2C+N.N.%22
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