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Searched for: author%3A%22Sadeghian+Marnani%2C+H.%22
(1 - 15 of 15)
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A new horizon: Using heat to measure distance in high performance metrology solutions
Towards an effective reduction of intensity noise in laser diodes
Meta-instrument: An opto-mechanical platform for imaging near-field optical instruments
Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy
Helium-ion-beam-induced growth of 3-dimensional AFM probes
Parallel, Miniaturized Scanning Probe Microscope for Defect Inspection and Review
High-throughput parallel SPM for metrology, defect, and mask inspection
Non-contact distance measurement and profilometry using thermal near-field radiation towards a high resolution inspection and metrology solution
Transient tip-sample interactions in high-speed AFM imaging of 3D nano structures
Mechanics of Ultra-sensitive Nanoelectromechanical Silicon Cantilevers: A Combined Experimental-Theoretical Approach
Phase lag deduced information in photo-thermal actuation for nano-mechanical systems characterization
Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers
A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points
Reduction of laser diode intensity noise in optical beam defection systems
Meta-instrument: An opto-mechanical platform for imaging near-field optical instruments
Searched for: author%3A%22Sadeghian+Marnani%2C+H.%22
(1 - 15 of 15)
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