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Wu, L. (author), Rao, Siddharth (author), Taouil, M. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Hamdioui, S. (author)Understanding the defects in magnetic tunnel junctions (MTJs) and their faulty behaviors are paramount for developing high-quality tests for STT-MRAM. This paper characterizes and models intermediate (IM) state defects in MTJs; IM state manifests itself as an abnormal third resistive state, apart from the two bi-stable states of MTJ. We...conference paper 2021
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Köylü, T.C. (author), Okkerman, Hans (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)Internet of things (IoT) devices are appearing in all aspects of our digital life. As such, they have become prime targets for attackers and hackers. An adequate protection against attacks is only possible when the confidentiality and integrity of the data and applications of these devices are secured. State-of-the-art solutions mostly address...conference paper 2021
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Caetano Garaffa, L. (author), Aljuffri, A.A.M. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author), Sepulveda, Johanna (author)Spiking Neural Networks (SNNs) are a strong candidate to be used in future machine learning applications. SNNs can obtain the same accuracy of complex deep learning networks, while only using a fraction of its power. As a result, an increase in popularity of SNNs is expected in the near future for cyber physical systems, especially in the...conference paper 2021
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Cardoso Medeiros, G. (author), Fieback, M. (author), Copetti, Thiago (author), Gebregiorgis, A.B. (author), Taouil, M. (author), Bolzani Poehls, L. M. (author), Hamdioui, S. (author)Manufacturing defects in FinFET SRAMs can cause hard-to-detect faults such as Undefined State Faults (USFs). Detection of USFs is not trivial, as they may not lead to incorrect functionality. Nevertheless, undetected USFs may have a severe impact on the memory's quality: they can cause random read outputs, which might lead to test escapes and no...conference paper 2021
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Wu, L. (author), Rao, Siddharth (author), Taouil, M. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Hamdioui, S. (author)Understanding the manufacturing defects in magnetic tunnel junctions (MTJs), which are the data-storing elements in STT-MRAMs, and their resultant faulty behaviors are crucial for developing high-quality test solutions. This paper introduces a new type of MTJ defect: synthetic anti-ferromagnet flip (SAFF) defect, wherein the magnetization in...conference paper 2021
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Taouil, M. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Sepulveda, Johanna (author)Dynamic Random Access Memory (DRAM)-based systems are widely used in mobile and portable applications where low-cost and high-storage memory capability are required. However, such systems are prone to attacks. A latent threat to DRAM-based system security is the so-called Rowhammer attacks. By repeatedly accessing memory, an attacker is able to...conference paper 2021
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Fieback, M. (author), Cardoso Medeiros, G. (author), Gebregiorgis, A.B. (author), Aziza, Hassen (author), Taouil, M. (author), Hamdioui, S. (author)Industry is prototyping and commercializing Resistive Random Access Memories (RRAMs). Unfortunately, RRAM devices introduce new defects and faults. Hence, high-quality test solutions are urgently needed. Based on silicon measurements, this paper identifies a new RRAM unique fault, the Intermittent Undefined State Fault (IUSF); this fault causes...conference paper 2021
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Cardoso Medeiros, G. (author), Fieback, M. (author), Gebregiorgis, A.B. (author), Taouil, M. (author), Bolzani Poehls, L. (author), Hamdioui, S. (author)Manufacturing defects in FinFET SRAMs can cause hard-to-detect faults such as Random Read Faults (RRFs). Detection of RRFs is not trivial, as they may not lead to incorrect outputs. Undetected RRFs become test escapes, which might lead to no-trouble-found devices and early in-field failures. Therefore, the detection of RRFs is of utmost...conference paper 2021
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Köylü, T.C. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)Artificial neural networks are currently used for many tasks, including safety critical ones such as automated driving. Hence, it is very important to protect them against faults and fault attacks. In this work, we propose two fault injection attack detection mechanisms: one based on using output labels for a reference input, and the other on...conference paper 2021
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Copetti, Thiago (author), Cardoso Medeiros, G. (author), Taouil, M. (author), Hamdioui, S. (author), Poehls, Leticia Bolzani (author), Balen, Tiago (author)Fin Field-Effect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. Despite demonstrating improvements on short channel effect and overcoming the growing leakage problem of planar CMOS...conference paper 2020
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Yu, J. (author), Abu Lebdeh, M.F.M. (author), Du Nguyen, H.A. (author), Taouil, M. (author), Hamdioui, S. (author)Conventional computing architectures and the CMOS technology that they are based on are facing major challenges such as the memory bottleneck making the memory access for data transfer a major killer of energy and performance. Computation-in-memory (CIM) paradigm is seen as a potential alternative that could alleviate such problems by adding...conference paper 2020
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Wu, L. (author), Fieback, M. (author), Taouil, M. (author), Hamdioui, S. (author)This paper introduces a new test approach: device-aware test (DAT) for emerging memory technologies such as MRAM, RRAM, and PCM. The DAT approach enables accurate models of device defects to obtain realistic fault models, which are used to develop high-quality and optimized test solutions. This is demonstrated by an application of DAT to pinhole...conference paper 2020
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Cardoso Medeiros, G. (author), Cem Gursoy, Cemil (author), Wu, L. (author), Fieback, M. (author), Jenihhin, Maksim (author), Taouil, M. (author), Hamdioui, S. (author)Manufacturing defects can cause faults in FinFET SRAMs. Of them, easy-to-detect (ETD) faults always cause incorrect behavior, and therefore are easily detected by applying sequences of write and read operations. However, hard-to-detect (HTD) faults may not cause incorrect behavior, only parametric deviations. Detection of these faults is of...conference paper 2020
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Reinbrecht, Cezar (author), Aljuffri, A.A.M. (author), Hamdioui, S. (author), Taouil, M. (author), Forlin, Bruno E. (author), Sepulveda, Johanna (author)Multi-Processor System-on-Chips (MPSoCs) are popular computational platforms for a wide variety of applications due to their energy efficiency and flexibility. Like many other platforms they are vulnerable to Side Channel Attacks (SCAs). In particular, Logical SCAs (LSCAs) are very powerful as sensitive information can be retrieved by simply...conference paper 2020
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Ghasempouri, Tara (author), Raik, Jaan (author), Paul, Kolin (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)In the recent years, cache based side-channel attacks have become a serious threat for computers. To face this issue, researches have been looking at verifying the security policies. However, these approaches are limited to manual security verification and they typically work for a small subset of the attacks. Hence, an effective verification...conference paper 2020
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Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author), Niazmand, Behrad (author), Ghasempouri, Tara (author), Raik, Jaan (author), Sepulveda, Johanna (author)Cache attacks are one of the most wide-spread and dangerous threats to embedded computing systems' security. A promising approach to detect such attacks at runtime is to monitor the System-on-Chip (SoC) behavior. However, designing a secure SoC capable of detecting such attacks is very challenging: the monitors should be lightweight in order...conference paper 2020
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Masoumian, S. (author), Selimis, Georgios (author), Maes, Roel (author), Schrijen, Geert-Jan (author), Hamdioui, S. (author), Taouil, M. (author)In this paper, we develop an analytical PUF model based on a compact FinFET transistor model that calculates the PUF stability (i.e. PUF static noise margin (PSNM)) for FinFET based SRAMs. The model enables a quick design space exploration and may be used to identify critical parameters that affect the PSNM. The analytical model is validated...conference paper 2020
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Köylü, T.C. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)Physical fault injection attacks are becoming an important threat to computer systems, as fault injection equipment becomes more and more accessible. In this work, we propose a new strategy to detect fault attacks in cryptosystems. We use a recurrent neural network (RNN) to detect problems in the program flow caused by injected faults. Our...conference paper 2020
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Wu, L. (author), Rao, Siddharth (author), Taouil, M. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Hamdioui, S. (author)As a unique mechanism for MRAMs, magnetic coupling needs to be accounted for when designing memory arrays. This paper models both intra- and inter-cell magnetic coupling analytically for STT-MRAMs and investigates their impact on the write performance and retention of MTJ devices, which are the data-storing elements of STT-MRAMs. We present...conference paper 2020
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Hamdioui, S. (author), Fieback, M. (author), Nagarajan, S. (author), Taouil, M. (author)Today's computing architectures and device technologies are incapable of meeting the increasingly stringent demands on energy and performance posed by evolving applications. Therefore, alternative novel post-CMOS computing architectures are being explored. One of these is a Computation-in-Memory (CIM) architecture based on memristive devices; it...conference paper 2019