Erratum to: Sub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications (Nano Research, (2020), 13, 12, (3416-3424), 10.1007/s12274-020-3029-9)

Ref. [56] was unfortunately wrong, Instead of [56] Corless, R. M.; Gonnet, G. H.; Hare, D. E. G.; Jeffrey, D. J.; Knuth, D. E. On the Lambert W function. Adv. Comput. Math. 1996, 5, 329–359. It should be changed to Biswas, R. K.; Khan, P.; Mukherjee, S.; Mukhopadhyay, A. K.; Ghosh, J.; Muraleedharan, K. Study of short range structure of...

Characterization of the defect density states in MoO_x for c-Si solar cell applications

Thin layers of MoO_x have been deposited by thermal evaporation followed by post-deposition annealing. The density of states distributions of the MoO_x films were extracted deconvoluting the absorption spectra, measured by a photothermal deflection spectroscopy setup, including the small polaron contribution. Results...

Sub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications

The application of molybdenum oxide in the photovoltaic field is gaining traction as this material can be deployed in doping-free heterojunction solar cells in the role of hole selective contact. For modeling-based optimization of such contact, knowledge of the molybdenum oxide defect density of states (DOS) is crucial. In this paper, we...