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Zhang, S. (author), Kwakernaak, C. (author), Tichelaar, F.D. (author), Sloof, W.G. (author), Kuzmina, M. (author), Herbig, M. (author), Raabe, D. (author), Brück, E. (author), Van der Zwaag, S. (author), Van Dijk, N.H. (author)
The autonomous repair mechanism of creep cavitation during high-temperature deformation has been investigated in Fe-Au and Fe-Au-B-N alloys. Combined electron-microscopy techniques and atom probe tomography reveal how the improved creep properties result from Au precipitation within the creep cavities, preferentially formed on grain boundaries...
journal article 2015
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Cartamil Bueno, S.J. (author), Steeneken, P.G. (author), Tichelaar, F.D. (author), Navarro Moratalla, E. (author), Venstra, W.J. (author), Leeuwen, R. (author), Coronado, E. (author), Van der Zant, H.S.J. (author), Steele, G.A. (author), Castellanos-Gomez, A. (author)
Controlling the strain in two-dimensional (2D) materials is an interesting avenue to tailor the mechanical properties of nanoelectromechanical systems. Here, we demonstrate a technique to fabricate ultrathin tantalum oxide nanomechanical resonators with large stress by the laser oxidation of nano-drumhead resonators composed of tantalum...
journal article 2015
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Yalcin, A.O. (author), Goris, B. (author), Van Dijk-Moes, R.J.A. (author), Fan, Z. (author), Erdamar, A.K. (author), Tichelaar, F.D. (author), Vlugt, T.J.H. (author), Van Tendeloo, G. (author), Bals, S. (author), Vanmaekelbergh, D. (author), Zandbergen, H.W. (author), Van Huis, M.A. (author)
In this work, we investigate the thermal evolution of CdSe–CdS–ZnS core–multishell quantum dots (QDs) in situ using transmission electron microscopy (TEM). Starting at a temperature of approximately 250 °C, Zn diffusion into inner layers takes place together with simultaneous evaporation of particularly Cd and S. As a result of this...
journal article 2014
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Yalcin, A.O. (author), Fan, Z. (author), Goris, B. (author), Li, W.F. (author), Koster, R.S. (author), Fang, C.M. (author), Van Blaaderen, A. (author), Casavola, M. (author), Tichelaar, F.D. (author), Bals, S. (author), Van Tendeloo, G. (author), Vlugt, T.J.H. (author), Vanmaekelbergh, D. (author), Zandbergen, H.W. (author), Van Huis, M.A. (author)
Here, we show a novel solid?solid?vapor (SSV) growth mechanism whereby epitaxial growth of heterogeneous semiconductor nanowires takes place by evaporation-induced cation exchange. During heating of PbSe-CdSe nanodumbbells inside a transmission electron microscope (TEM), we observed that PbSe nanocrystals grew epitaxially at the expense of CdSe...
journal article 2014
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Malladi, S. (author), Shen, C. (author), Xu, Q. (author), De Kruijff, T. (author), Yücelen, E. (author), Tichelaar, F. (author), Zandbergen, H. (author)
An approach to carry out chemical reactions using aggressive gases in situ in a transmission electron microscope (TEM), at ambient pressures of 1.5 bar using a windowed environmental cell, called a nanoreactor, is presented here. The nanoreactor coupled with a specially developed holder with platinum tubing permits the usage of aggressive...
journal article 2013
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Sharma, K. (author), Ponomarev, M.V. (author), Verheijen, M.A. (author), Kunz, O. (author), Tichelaar, F.D. (author), Van de Sanden, M.C.M. (author), Creatore, M. (author)
In this paper, we report on the deposition of amorphous silicon (a-Si:H) films at ultra-high growth rate (11–60?nm/s) by means of the expanding thermal plasma technique, followed by solid-phase crystallization (SPC). Large-grain (?1.5??m) polycrystalline silicon was obtained after SPC of high growth rate (?25?nm/s) deposited a-Si:H films. The...
journal article 2012
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Mejia, J. (author), Valembois, V. (author), Piret, J.P. (author), Tichelaar, F. (author), Van Huis, M. (author), Masereel, B. (author), Toussaint, O. (author), Delhalle, J. (author), Mekhalif, Z. (author), Lucas, S. (author)
The evolution of the particle size distribution and the surface composition of silicon carbide and titanium carbide nanoparticle (NP) dispersions were studied. The pre-dispersions were prepared using two commonly used protocols for dispersion: stirring and sonication. Two dispersants were investigated (water and Pluronic F108 1 %) at two stages:...
journal article 2012
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Tirumalasetty, G.K. (author), Van Huis, M.A. (author), Fang, C.M. (author), Xu, Q. (author), Tichelaar, F.D. (author), Hanlon, D.N. (author), Sietsma, J. (author), Zandbergen, H.W. (author)
Multiphase steels utilising composite strengthening may be further strengthened via grain refinement or precipitation by the addition of microalloying elements. In this study a Nb microalloyed steel comprising martensite, bainite and retained austenite has been studied. By means of transmission electron microscopy (TEM), we have investigated the...
journal article 2011
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He, S.M. (author), Van Dijk, N.H. (author), Paladugu, M. (author), Schut, H. (author), Kohlbrecher, J. (author), Tichelaar, F.D. (author), Van der Zwaag, S. (author)
We performed in situ time-resolved small-angle neutron scattering (SANS) measurements on high-purity Fe-Cu and Fe-Cu-B-N alloys during isothermal aging at 550 °C in order to study the potential self-healing of deformation-induced defects by nanosized Cu precipitation. Three different samples with 0%, 8%, and 24% prestrain were used to study the...
journal article 2010
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Zijlstra, T. (author), Lodewijk, C.F.J. (author), Vercruyssen, N. (author), Tichelaar, F.D. (author), Loudkov, D.N. (author), Klapwijk, T.M. (author)
High critical current-density (10?to?420?kA/cm2) superconductor-insulator-superconductor tunnel junctions with aluminum nitride barriers have been realized using a remote nitrogen plasma from an inductively coupled plasma source operated in a pressure range of 10?3–10?1?mbar. We find a much better reproducibility and control compared to previous...
journal article 2007
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Gao, J.R. (author), Hajenius, M. (author), Tichelaar, F.D. (author), Klapwijk, T.M. (author), Voronov, B. (author), Grishin, E. (author), Gol'tsman, G. (author), Zorman, C.A. (author), Mehregany, M. (author)
The authors have realized NbN (100) nanofilms on a 3C-SiC (100)/Si(100) substrate by dc reactive magnetron sputtering at 800?°C. High-resolution transmission electron microscopy (HRTEM) is used to characterize the films, showing a monocrystalline structure and confirming epitaxial growth on the 3C-SiC layer. A film ranging in thickness from 3.4...
journal article 2007
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Cheynet, M.C. (author), Pokrant, S. (author), Tichelaar, F.D. (author), Rouvière, J.L. (author)
Valence electron energy loss spectroscopy (VEELS) and high resolution transmission electron microscopy (HRTEM) are performed on three different HfO2 thin films grown on Si (001) by chemical vapor deposition (CVD) or atomic layer deposition (ALD). For each sample the band gap (Eg) is determined by low-loss EELS analysis. The Eg values are then...
journal article 2007
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Pujada, B.R. (author), Tichelaar, F.D. (author), Janssen, G.C.A.M. (author)
Tungsten carbide-diamond like carbon (WC-DLC) multilayer coatings have been prepared by sputter deposition from a tungsten-carbide target and periodic switching on and off of the reactive acetylene gas flow. The stress in the resulting WC-DLC multilayers has been studied by substrate curvature. Periodicity and microstructure have been studied by...
journal article 2007
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Zandbergen, H.W. (author), Tichelaar, F.D. (author), Alkemade, P.F.A. (author)
A method for the formation of nanometer-scale electrodes, wherein strip of electrically conductive material, in particular metal, is provided with a longitudinal direction, a width direction and a thickness direction and then, with the aid of an electron beam, a groove is provided in a top surface of the strip, in the width direction of the...
patent 2006
document
Kessels, M.J.H. (author), Bijkerk, F. (author), Tichelaar, F.D. (author), Verhoeven, J. (author)
We developed and demonstrate an analysis method in which we calibrate the intensity scale of cross-sectional transmission electron microscopy (TEM) using Cu K? reflectometry. This results in quantitative in-depth density profiles of multilayer structures. Only three free parameters are needed to obtain the calibrated profiles, corresponding to...
journal article 2005
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Grachev, S.Y. (author), Tichelaar, F.D. (author), Janssen, G.C.A.M. (author)
We studied the tensile stress and grain-width evolution in sputter-deposited Cr films with thickness from 20?nm to 2.7??m. Films were deposited in an industrial Hauzer 750 physical vapor deposition machine at 50–80?°C. The films exhibited a columnar microstructure. A power law behavior of the tensile stress as well as of the average grain width...
journal article 2005
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Lazar, S. (author), Weyher, J.L. (author), Macht, L. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author)
Photochemical (PEC) etching and transmission electron microscopy (TEM) have been used to study the defects in hetero-epitaxial GaN layers. TEM proved that PEC etching reveals not only dislocations but also nanopipes in the form of protruding, whisker-like etch features. It is shown by diffraction contrast techniques that the nanopipes are screw...
journal article 2004
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Moore, K.T. (author), Chung, B.W. (author), Morton, S.A. (author), Schwartz, A.J. (author), Tobin, J.G. (author), Lazar, S. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author), Söderlind, P. (author), van der Laan, G. (author)
journal article 2004
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Tichelaar, P.J. (author)
Document(en) uit de collectie Chemische Procestechnologie
report 1958
document
Tichelaar, G.W. (author)
doctoral thesis 1956
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