Searched for: subject%3A%22metrological%255C+instrumentation%22
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Ellis, J.D. (author), Meskers, A.J.H. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
Displacement interferometry is widely used for accurately characterizing nanometer and subnanometer displacements in many applications. In many modern systems, fiber delivery is desired to limit optical alignment and remove heat sources from the system, but fiber delivery can exacerbate common interferometric measurement problems, such as...
journal article 2011
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Cui, M. (author), Zeitouny, M.G. (author), Bhattacharya, N. (author), Van den Berg, S.A. (author), Urbach, H.P. (author), Braat, J.J.M. (author)
We experimentally demonstrate that a femtosecond frequency comb laser can be applied as a tool for longdistance measurement in air. Our method is based on the measurement of cross correlation between individual pulses in a Michelson interferometer. From the position of the correlation functions, distances of up to 50 m have been measured. We...
journal article 2009
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Joo, K.N. (author), Ellis, J.D. (author), Spronck, J.W. (author), Van Kan, P.J.M. (author), Munnig Schmidt, R.H. (author)
We describe a simple heterodyne laser interferometer that has subnanometer periodic errors and is applicable to industrial fields. Two spatially separated beams can reduce the periodic errors, and the use of a right-angle prism makes the optical configuration much simpler than previous interferometers. Moreover, the optical resolution can be...
journal article 2009