Scanning Probe Microscopy Facility for Operando Study of Redox Processes on Lithium ion Battery Electrodes

An Atomic Force Microscope (AFM) is combined with a special designed glovebox system and coupled to a Galvanostat/Potentiostat to allow measurements on electrochemical properties for battery research. An open cell design with electrical contacts makes it possible to reach the electrode surface with the cantilever so as to perform measurements...

Transport through a single donor in p-type silicon

Single phosphorus donors in silicon are promising candidates as qubits in the solid state. Here, we present low temperature scanning probe microscopy and spectroscopy measurements of individual phosphorus dopants deliberately placed in p-type silicon ?1?nm below the surface. The ability to image individual dopants combined with scanning...

Hot-spot detection and calibration of a scanning thermal probe with a noise thermometry gold wire sample

Measuring the temperature profile of a nanoscale sample using scanning thermal microscopy is challenging due to a scanning probe's non-uniform heating. In order to address this challenge, we have developed a calibration sample consisting of a 1-?m wide gold wire, which can be heated electrically by a small bias current. The Joule heating in the...