AD

A. Dekhovich

7 records found

Wafer map defect recognition is a vital part of the semiconductor manufacturing process that requires a high level of precision. Measurement tools in such manufacturing systems can scan only a small region (patch) of the map at a time. However, this can be resource-intensive and ...
We introduce a new continual (or lifelong) learning algorithm called LDA-CP &S that performs segmentation tasks without undergoing catastrophic forgetting. The method is applied to two different surface defect segmentation problems that are learned incrementally, i.e., provid ...
Deep learning models have made enormous strides over the past decade. However, they still have some disadvantages when dealing with changing data streams. One of these flaws is the phenomenon called catastrophic forgetting. It occurs when a model learns multiple tasks sequentiall ...
Physics-informed neural networks (PINNs) have recently become a powerful tool for solving partial differential equations (PDEs). However, finding a set of neural network parameters that fulfill a PDE at the boundary and within the domain of interest can be challenging and non-uni ...
Current deep neural networks (DNNs) are overparameterized and use most of their neuronal connections during inference for each task. The human brain, however, developed specialized regions for different tasks and performs inference with a small fraction of its neuronal connection ...
Data-driven modeling in mechanics is evolving rapidly based on recent machine learning advances, especially on artificial neural networks. As the field matures, new data and models created by different groups become available, opening possibilities for cooperative modeling. Howev ...
The human brain is capable of learning tasks sequentially mostly without forgetting. However, deep neural networks (DNNs) suffer from catastrophic forgetting when learning one task after another. We address this challenge considering a class-incremental learning scenario where th ...