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VV Rodatis
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Properties of (Nb0.35, Ti0.15)-xN1-x thin films deposited on silicon wafers at ambient substrate temperature.
Journal article -
N Iossad
,
AV Mijiritskii
,
VV Rodatis
,
N.M. van der Pers
,
BD Jackson
,
JR Gao
,
SN Polyakov
,
PN Dmitriev
,
T.M. Klapwijk