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Stefan Sar

7 records found

Authored

(BZA)2PbBr4

A potential scintillator for photon-counting computed tomography detectors

Due to recent development in detector technology, photon-counting computed tomography (PCCT) has become a rapidly emerging medical imaging technology. Current PCCT systems rely on the direct conversion of X-ray photons into charge pulses, using CdTe, CZT, or Si semiconductor d ...

Photon-counting detectors (PCD) for medical X-ray computed tomography (CT) are designed to measure the number of X-ray photons incident on a detector pixel as well as the energy of the individual X-rays. They are expected to yield improvements in image quality for a given radiati ...

X-ray detectors with photon-counting capabilities promise to revolutionise medical imaging. For an efficient comparison of detectors of various materials and with different setup choices, reliable detector performance measures are needed. The detector point spread function (PS ...

LaBr3:Ce and silicon photomultipliers

Towards the optimal scintillating photon-counting detector

We investigate fast silicon photomultiplier (SiPM)-based scintillation detectors for X-ray photon-counting applications, e.g., photon-counting computed tomography (CT). Such detectors may be an alternative to CdTe/CdZnTe (CZT) and Si detectors, which face challenges related to ...

We investigate X-ray photon-counting scintillation detectors with silicon photomultiplier (SiPM) readout. These circumvent some drawbacks of direct-conversion detectors. We measured observed count rate (OCR) versus X-ray tube current for single-pixel detectors consisting of LY ...

Purpose: The implementation of photon-counting detectors is widely expected to be the next breakthrough in X-ray computed tomography (CT) instrumentation. A small number of prototype scanners equipped with direct-conversion detectors based on room-temperature semiconductors, s ...

Positron annihilation lifetime spectroscopy (PALS) and Doppler broadening positron annihilation spectroscopy (DB-PAS) depth profiling demonstrate pronounced growth of vacancy clusters at the grain boundaries of as-deposited Al-doped ZnO films deposited as transparent conductive o ...